K. Butler
发表
K. Butler,
J. Saxena,
T. Fryars,
2004,
2004 International Conferce on Test.
M. Ray Mercer,
Kenneth M. Butler,
M. R. Mercer,
1992
.
C. P. Ravikumar,
Mark Mohammad Tehranipoor,
Kenneth M. Butler,
2007,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Kenneth M. Butler,
K. Butler,
1999,
IEEE Des. Test Comput..
Don E. Ross,
M. Ray Mercer,
Kenneth M. Butler,
1991,
J. Electron. Test..
M. Ray Mercer,
Kenneth M. Butler,
Jaehong Park,
1999,
Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).
M. Ray Mercer,
Kenneth M. Butler,
Michael R. Grimaila,
2001,
IEEE Des. Test Comput..
M. R. Mercer,
R. Kapur,
D. E. Ross,
1991,
Proceedings of the European Conference on Design Automation..
L. Whetsel,
J. Saxena,
K.M. Butler,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Kenneth M. Butler,
K. Butler,
2002,
Proceedings. International Test Conference.
M. Ray Mercer,
Kenneth M. Butler,
M. R. Mercer,
1992
.
Kenneth M. Butler,
Xin Li,
José Machado da Silva,
2014,
2014 International Test Conference.
Kenneth M. Butler,
Kwang-Ting Cheng,
Wangyang Zhang,
2013,
2013 IEEE International Test Conference (ITC).
Kenneth M. Butler,
Sule Ozev,
Ender Yilmaz,
2011,
2011 IEEE International Test Conference.
Kenneth M. Butler,
Sule Ozev,
Ender Yilmaz,
2010,
2010 IEEE International Test Conference.
P. Nigh,
P. Maxwell,
R. Aitken,
1997,
Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).
Kenneth M. Butler,
David J. Campbell,
Jayashree Saxena,
2002,
Proceedings. International Test Conference.
Janak H. Patel,
Kenneth M. Butler,
Frank F. Hsu,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Kenneth M. Butler,
Jayashree Saxena,
K. Butler,
2000,
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
Kenneth M. Butler,
Li Xu,
Degang Chen,
2017,
2017 IEEE International Test Conference (ITC).
D. Steiss,
B. Bell,
M. Maccanelli,
1992,
Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems.