D. Sana

发表

Mechanism of negative bias temperature instability in CMOS devices: degradation, recovery and impact of nitrogen

M.A. Alam, S. Mahapatra, P. Bharath Kumar, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

EMERGENCE OF PLASMID MEDIATED COLISTIN RESISTANCE GENE MCR-1 IN CARBAPENEM-RESISTANT PSEUDOMONAS AERUGINOSA CLINICAL ISOLATES FROM ALGERIA: A NEW SUCCESSFUL RESISTANCE COMBINATION TOWARD A THERAPEUTIC IMPASSE?

D. Sana, Hassaine Hafida, A. Ammar, 2020 .