H. Aono

Theory and Practice of On-the-fly and Ultra-fast VT Measurements for NBTI Degradation: Challenges and Opportunities

M.A. Alam, S. Mahapatra, A. Islam, 2007, 2007 IEEE International Electron Devices Meeting.

Theory and Practice of Onthe-fly and Ultra-fast VT Measurements for NBTI Degradation : Challenges and Opportunities *

S. Mahapatra, E. Murakami, M. A. Alam, 2007 .

Revisited study of fluorine implantation impact on negative bias temperature instability for input/output device of automotive micro controller unit

Y. Yamaguchi, Tatsuo Shimizu, S. Tsuda, 2018 .

A new aspect of time-dependent clustering model for non-uniform dielectric TDDB

H. Aono, N. Suzumura, M. Ogasawara, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

A coarse-graining approach to rate equations of the composite AC-NBTI model

E. Murakami, H. Aono, M. Ogasawara, 2015, IEEE Transactions on Electron Devices.

A study of SRAM NBTI by OTF measurement

K. Shiga, E. Murakami, K. Yanagisawa, 2008, 2008 IEEE International Reliability Physics Symposium.