C. S. Ackermann

Supplier improvement via SPC applications workshops

C. S. Ackermann, C. Ackermann, 1993 .

Evaluating Destructive Measurements using Gage R & R

C. S. Ackermann, 1993, Proceedings. IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop.

Supplier improvement via SPC application workshops

C. S. Ackermann, C. Ackermann, 1991, [1991 Proceedings] IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop.

Monitoring supplier quality at p.p.m. levels

C. S. Ackermann, J. M. Fabia, 1992, [1992 Proceedings] IEEE/SEMI International Semiconductor Manufacturing Science Symposium.

Monitoring supplier quality at PPM levels

C. S. Ackermann, J. M. Fabia, 1993 .