M. Cho

Impact of die-to-die thermal coupling on the electrical characteristics of 3D stacked SRAM cache

S. Mukhopadhyay, R. Rao, S. Chatterjee, 2012, 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM).

GIT-CERCS Thermal Field Management for Many-core Processors

S. Mukhopadhyay, S. Yalamanchili, M. Cho, 2009 .

Thermal Field Management for Many-core Processors

S. Mukhopadhyay, S. Yalamanchili, M. Cho, 2009 .

Theoretical and numerical analysis of effects of sudden expansion and contraction on compressible flow phenomena in Hyperloop system

Jaiyoung Ryu, Jih-Woon Kim, M. Cho, 2022, Aerospace Science and Technology.

System Impact of 3D Processor-Memory Interconnect: A Limit Study

William J. Song, S. M. Hassan, S. Mukhopadhyay, 2011 .

Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform

B. Gill, K. Sutaria, B. Ajdari, 2022, 2022 IEEE International Reliability Physics Symposium (IRPS).

Effects of tail shapes/lengths of Hyperloop pod on aerodynamic characteristics and wave phenomenon

Jaiyoung Ryu, Jih-Woon Kim, M. Cho, 2022, Aerospace Science and Technology.

Experimental Analysis of Aerodynamic Characteristics in the Hyperloop System

D. H. Kim, Jaiyoung Ryu, M. Cho, 2023, Aerospace Science and Technology.

FMAX/VMIN and noise margin impacts of aging on domino read, static write, and retention of 8T 1R1W SRAM arrays in 22nm high-k/metal-gate tri-gate CMOS

Muhammad M. Khellah, James W. Tschanz, Carlos Tokunaga, 2017, 2017 Symposium on VLSI Circuits.

Thermal Investigation Into Power Multiplexing for Homogeneous Many-Core

Satish Kumar, Saibal Mukhopadhyay, Minki Cho, 2012 .

Thermal mangament of multicore processors using power multiplexing

Minki Cho, Satish Kumar, Saibal Mukhopadhyay, 2010, 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems.

Postsilicon Voltage Guard-Band Reduction in a 22 nm Graphics Execution Core Using Adaptive Voltage Scaling and Dynamic Power Gating

James Tschanz, Vivek De, Jaydeep P. Kulkarni, 2017, IEEE Journal of Solid-State Circuits.