D. Lowney

发表

T. N. Hansen, H. Chapman, J. Hajdu, 2005, Physical review letters.

Femtosecond versus nanosecond laser micro-machining of InP: a nondestructive three-dimensional analysis of strain

A. Danilewsky, P. McNally, D. Lowney, 2007 .

Evaluation of mechanical stresses in silicon substrates due to lead-tin solder bumps via synchrotron X-ray topography and finite element modeling

A. Danilewsky, P. McNally, J. Riikonen, 2003 .

Mapping of mechanical stresses in silicon substrates due to lead–tin solder bump reflow process via synchrotron x-ray topography and finite element modelling

P. McNally, J. Riikonen, D. Lowney, 2003 .

E valuation of mechanical stresses in silicon substrates due to lead-tin solder bumps via synchrotron X-ray topography and finite element modeling

P. McNally, J. Riikonen, D. Lowney, 2003 .

Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam X-ray topography

A. Danilewsky, P. McNally, D. Lowney, 2001 .

Total reflection X-ray topography for the observation of misfit dislocation strain at the surface of a Si/Ge-Si heterostructure.

A. Danilewsky, P. McNally, A. Willoughby, 2000, Journal of X-ray science and technology.

Misfit dislocations in GaAsN/GaAs interface

P. McNally, M. Sopanen, H. Lipsanen, 2003 .

Examination of mechanical stresses in silicon substrates due to lead–tin solder bumps via micro-Raman spectroscopy and finite element modelling

Juha Riikonen, Patrick J. McNally, W. M. Chen, 2002 .

Investigation of Mechanical Stresses in Underlying Silicon due to Lead-Tin Solder Bumps via Synchrotron X-Ray Topography and Finite Element Analysis

A. Danilewsky, P. McNally, D. Lowney, 2001 .

Atomic-scale visualization of inertial dynamics. Journal:science

Klaus Sokolowski-Tinten, Aaron M. Lindenberg, Adrian L. Cavalieri, 2005 .

Epitaxial lateral overgrowth of GaN on sapphire - An examination of epitaxy quality using synchrotron X-ray topography.

A. Danilewsky, P. McNally, D. Lowney, 2001 .

Synchrotron x-ray topography studies of epitaxial lateral overgrowth of GaN on sapphire

A. Danilewsky, P. McNally, D. Lowney, 1999 .

Investigation of strain induced effects in silicon wafers due to proximity rapid thermal processing using micro-Raman spectroscopy and synchrotron x-ray topography

A. Danilewsky, P. McNally, T. Perova, 2002 .

Atomic-Scale Visualization of Inertial Dynamics

T. N. Hansen, H. Chapman, J. Hajdu, 2005, Science.

Streaking and splashing: design of a grazing incidence x-ray streak camera and time-resolved measurements of the structure of water

D. Lowney, 2006 .

Time-resolved measurements of the structure of water at constant density.

Y. Acremann, R. Falcone, A. Lindenberg, 2005, The Journal of chemical physics.

Observation of Misfit Dislocation Strain‐Induced Surface Features for a Si/Ge–Si Heterostructure Using Total Reflection X‐Ray Topography

A. Danilewsky, P. McNally, J. Bonar, 2000 .

Determination of crystal misorientation in epitaxial lateral overgrowth of GaN

A. Danilewsky, P. McNally, J. Riikonen, 2002 .

Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Eric M. Gullikson, Roger W. Falcone, Andrew G. MacPhee, 2004, SPIE Optics + Photonics.

Evaluation of the optical properties of epitaxial lateral overgrown gallium nitride on sapphire and the role of optically active metastable defects using cathodoluminescence and photoluminescence spectroscopy

D. P. Lowney, L. Considine, Patrick J. McNally, 2005 .

A Heterogeneous 3D-IC Consisting of Two 28 nm FPGA Die and 32 Reconfigurable High-Performance Data Converters

Anthony Collins, Liam Madden, Patrick Lynch, 2014, IEEE Journal of Solid-State Circuits.

Atomic-Scale Visualization of

R. Ischebeck, D. Siddons, H. Schlarb, 2005 .

Tilted-wing-induced stress distribution in epitaxial lateral overgrown GaN

P. McNally, J. Riikonen, D. Lowney, 2003 .

Observation of structural anisotropy and the onset of liquidlike motion during the nonthermal melting of InSb.

H. Chapman, J. Hajdu, R. Ischebeck, 2005, Physical review letters.