D. Lübbert

发表

Magnified x-ray phase imaging using asymmetric Bragg reflection : Experiment and theory

P. Modregger, P. Schäfer, R. Köhler, 2006 .

μm-resolved high resolution X-ray diffraction imaging for semiconductor quality control

E. Boller, T. Baumbach, J. Härtwig, 2000 .

Synchrotron area diffractometry as a tool for spatial high-resolution three-dimensional lattice misorientation mapping

D. Korytár, T. Baumbach, P. Pernot, 2003 .

Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces

J. Eymery, F. Fournel, T. Baumbach, 2000 .

Elastic stress relaxation in GaInAsP quantum wires on InP

S. Arai, H. Grahn, T. Baumbach, 1999 .

Local wing tilt analysis of laterally overgrown GaN by x-ray rocking curve imaging

S. Denbaars, S. Keller, T. Baumbach, 2005 .

In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays

U. Pietsch, Y. Zhuang, T. Baumbach, 1998 .

Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction

T. Baumbach, D. Lübbert, M. Gailhanou, 2000 .

Accurate rocking-curve measurements on protein crystals grown in a homogeneous magnetic field of 2.4 T.

E. Weckert, A. Meents, D. Lübbert, 2004, Acta crystallographica. Section D, Biological crystallography.

Lateral arrangement of self-assembled quantum dots in anSiGe/Si supertattice

G. Bauer, V. Holý, J. Stangl, 1999 .

Grazing incidence diffraction by laterally patterned semiconductor nanostructures

T. Baumbach, D. Lübbert, 1999 .

COPLANAR AND GRAZING INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM DOT MULTILAYERS

U. Pietsch, I. Vávra, F. Schäffler, 1998 .

Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices

C. Giannini, T. Baumbach, W. Stolz, 2000 .

Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory

U. Pietsch, A. Talneau, S. Ponti, 1999 .

Spatial resolution in Bragg‐magnified X‐ray images as determined by Fourier analysis

Peter Modregger, D. Lübbert, P. Modregger, 2007 .

Two dimensional diffraction enhanced imaging algorithm

P. Modregger, P. Schäfer, R. Köhler, 2007 .

Synchrotron Radiation Based Imaging Methods for Industrial Applications at the German Synchrotron ANKA

Timm Weitkamp, Alexander Rack, Lukas Helfen, 2007 .

Structural characterisation of a GaAs surface wire structure by triple axis X-ray grazing incidence diffraction

A. Forchel, U. Pietsch, K. Paschke, 1998 .

Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction

U. Pietsch, Y. Zhuang, F. Schäffler, 1999 .

X-ray structure investigation of lateral surface nanostructures : a full quantitative analysis of non-uniform lattice strain

D. Lübbert, M. Gailhanou, G. Baumbach, 1999 .

Grazing incidence diffraction by epitaxial multilayered gratings

Ullrich Pietsch, Anne Talneau, D. Lübbert, 1998 .

X-ray analysis of temperature induced defect structures in boron implanted silicon

J. R. Patel, T. Metzger, J. Arthur, 2002 .

Diffuse x-ray scattering from statistically inhomogeneous distributions of threading dislocations beyond the ergodic hypothesis

S. Denbaars, S. Keller, J. Speck, 2008 .

X‐ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN

S. Denbaars, S. Keller, T. Baumbach, 2006 .

ROCKING CURVE IMAGING STUDIES OF LATERALLY OVERGROWN GaAs AND GaSb EPITAXIAL LAYERS

Z. Zytkiewicz, A. Wierzbicka, D. Lübbert, 2009 .

Analysis of epitaxial laterally overgrown silicon structures by high resolution x‐ray rocking curve imaging

M. Hanke, T. Boeck, R. Köhler, 2009 .

Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging

C. Ferrari, D. Korytár, T. Baumbach, 2005 .

Clusters and Planar Defects in Boron Implanted Silicon an X-Ray Diffuse Scattering Study

J. R. Patel, T. Metzger, J. Arthur, 2000 .