J. Vohánka

发表

Ellipsometry of Layered Systems

I. Ohlídal, D. Franta, M. Cermák, 2018 .

Universal Dispersion Model for Characterization of Thin Films Over Wide Spectral Range

D. Franta, M. Cermák, J. Vohánka, 2018 .

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

I. Ohlídal, D. Franta, M. Cermák, 2018, Journal of Modern Optics.

Deposition of organosilicon coatings from trimethylsilyl acetate and oxygen gases in capacitively coupled RF glow discharge

V. Buršíková, M. Cermák, J. Vohánka, 2020 .

Spectroscopic ellipsometry of inhomogeneous thin films exhibiting thickness non-uniformity and transition layers.

I. Ohlídal, V. Buršíková, D. Franta, 2020, Optics express.

Combination of spectroscopic ellipsometry and spectroscopic reflectometry with including light scattering in the optical characterization of randomly rough silicon surfaces covered by native oxide layers

I. Ohlídal, D. Franta, J. Vohánka, 2019, Surface Topography: Metrology and Properties.

Different theoretical approaches at optical characterization of randomly rough silicon surfaces covered with native oxide layers

I. Ohlídal, D. Franta, J. Mistrík, 2018 .

Temperature dependent dispersion models applicable in solid state physics

I. Ohlídal, D. Franta, J. Vohánka, 2019, Journal of Electrical Engineering.

Constitutive equations describing optical activity in theory of dispersion

D. Franta, J. Vohánka, 2020 .

Chern–Simons theory in SIM(1) superspace

M. Faizal, J. Vohánka, 2015, 1503.04761.

Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

I. Ohlídal, P. Vašina, D. Franta, 2019, Coatings.

Optical Characterization of Thin Films Exhibiting Defects

I. Ohlídal, J. Vohánka, M. Čermák, 2018 .

Optical characterization of randomly microrough surfaces covered with very thin overlayers using effective medium approximation and Rayleigh–Rice theory

I. Ohlídal, D. Franta, J. Vohánka, 2017 .

Temperature-dependent dispersion model of float zone crystalline silicon

A. Giglia, I. Ohlídal, D. Franta, 2017 .

Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

I. Ohlídal, V. Buršíková, D. Franta, 2020 .

Optics of Inhomogeneous Thin Films with Defects: Application to Optical Characterization

I. Ohlídal, J. Vohánka, M. Čermák, 2020, Coatings.

Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films.

I. Ohlídal, V. Buršíková, J. Vohánka, 2020, Optics express.

Approximations of reflection and transmission coefficients of inhomogeneous thin films based on multiple-beam interference model

I. Ohlídal, D. Franta, J. Mistrík, 2019 .

Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films

I. Ohlídal, P. Vašina, D. Franta, 2019, Journal of Electrical Engineering.

Dispersion models describing interband electronic transitions combining Tauc's law and Lorentz model

I. Ohlídal, D. Franta, J. Vohánka, 2017 .

SIM(2) and supergraphs

J. Vohánka, Rikard von Unge, S. Petras, 2011, 1102.3856.

Ellipsometric characterization of highly non-uniform thin films with the shape of thickness non-uniformity modeled by polynomials.

I. Ohlídal, V. Buršíková, D. Franta, 2020, Optics express.

Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization

I. Ohlídal, P. Vašina, D. Franta, 2018, Surface and Interface Analysis.

Activation of polyethylene and polypropylene in atmospheric pressure glow discharge

M. Sira, P. Sťahel, V. Buršíková, 2004 .