L. Y. Chen

Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer.

L. Y. Chen, X. Feng, Y. Su, 1994, Applied optics.

Scanning ellipsometer by rotating polarizer and analyzer.

D. Lynch, L. Y. Chen, L Y Chen, 1987, Applied optics.

High pressure jump apparatus for measuring Grűneisen parameter of NaCl and studying metastable amorphous phase of poly (ethylene terephthalate)

Shiming Hong, L. Y. Chen, X. R. Liu, 2005 .

Measuring the isentropic compression curves and W-J parameters of tantalum and molybdenum via a pressure-jump method

L. Y. Chen, S. Hong, X. R. Liu, 2014 .