D. Emily

Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

R. L. Pease, L. Cohn, J. L. Titus, 1998 .

Enhanced low dose rate sensitivity (ELDRS) of linear circuits in a space environment

R. L. Pease, J. L. Titus, J. F. Krieg, 1999 .

Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator

R. L. Pease, Ronald D. Schrimpf, Hugh J. Barnaby, 1999 .

Enhanced low dose rate sensitivity (ELDRS) in a voltage comparator which only utilizes complementary vertical NPN and PNP transistors

J. L. Titus, M. Gehlhausen, D. Platteter, 1999 .

Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response

R. L. Pease, T. L. Turflinger, Ronald D. Schrimpf, 1999 .

Total Dose Indujced Hole Trapping and Interface State Generation in Bipolar Recessed Field Oxides

H. E. Boesch, D. Emily, R. Pease, 1985, IEEE Transactions on Nuclear Science.