S. Wen

Effect of threshold voltage implants on single-event error rates of D flip-flops in 28-nm bulk CMOS

J. S. Kauppila, L. W. Massengill, B. L. Bhuva, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect

B. L. Bhuva, R. D. Schrimpf, N. J. Gaspard, 2012, IEEE Transactions on Nuclear Science.

Estimation of Single-Event-Induced Collected Charge for Multiple Transistors Using Analytical Expressions

J. S. Kauppila, L. W. Massengill, B. L. Bhuva, 2015, IEEE Transactions on Nuclear Science.