S. H. Lau

发表

Jeff Gelb, Wenbing Yun, S. H. Lau, 2009, 2009 IEEE International Interconnect Technology Conference.

Jeff Gelb, Michael Feser, Wenbing Yun, 2009, Microscopy and Microanalysis.

Sharon Chen, David Reynolds, Vladimir A. Semenov, 2017, Optical Engineering + Applications.

G. Marshall, W. Yun, A. Browning, 2015, PloS one.

D. Vine, J. Gelb, K. Matusik, 2020, Microscopy and Microanalysis.

Ge Wang, Jeff Gelb, Wenbing Yun, 2009, Scanning Microscopies.

D. Vine, J. Gelb, S. Gul, 2022, 2022 IEEE Physical Assurance and Inspection of Electronics (PAINE).

D. Vine, J. Gelb, S. Gul, 2022, International Symposium on the Physical and Failure Analysis of Integrated Circuits.

W. Yun, H. Cui, A. Tkachuk, 2007, Microscopy and Microanalysis.