D.S.H. Chan

发表

Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithm

Wai Kin Chim, D. Chan, W. Chim, 1997 .

Optoelectronic material analysis and device failure analysis using SEM cathodoluminescence

J.C.H. Phang, Kin Leong Pey, Wai Kin Chim, 1994 .

Electron trajectory tracking algorithms for analysing voltage contrast signals in the scanning electron microscope

J.C.H. Phang, Wai Kin Chim, D.S.H. Chan, 1988 .

An improved drain-current-conductance method with substrate back-biasing

Wai Kin Chim, C. L. Lou, D.S.H. Chan, 1999 .

Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscope

Kin Leong Pey, K. Pey, D. Chan, 1993 .

Single contact optical beam induced currents (SCOBIC)-a new failure analysis technique

J.C.H. Phang, Glen Gilfeather, C. E. Soh, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

A Theoretical Model for Laser Cleaning of Microparticles in a Thin Liquid Layer

Yongfeng Lu, Wen Dong Song, D.S.H. Chan, 1998 .

Single contact optical beam induced currents (SCOBIC)-technique and applications

J.C.H. Phang, M. Palaniappan, G. Gilfeather, 2001, Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548).

Single contact electron beam induced currents (SCEBIC) in semiconductor junctions. Part I: Quantitative verification of SCEBIC model

S. Kolachina, D. Chan, J. Phang, 1998 .

An integrated (automated) photon emission microscope and MOSFET characterisation system for combined microscopic and macroscopic device analysis

J.C.H. Phang, W. K. Chim, C. L. Lou, 1999, Proceedings of the 1999 7th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.99TH8394).

Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

S. Kolachina, Ivica Orlić, Frank Watt, 1997 .

A Cleaning Model for Removal of Particles due to Laser-Induced Thermal Expansion of Substrate Surface

Yongfeng Lu, Kaidong D. Ye, Wen Dong Song, 1997 .

Low-frequency noise characterization of latent damage in thin oxides subjected to high-field impulse stressing

P. Lim, D. Chan, W. Chim, 1998, IEEE Electron Device Letters.

Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing

Wai Kin Chim, C. L. Lou, D. Chan, 1998 .

A theoretical model for laser removal of particles from solid surfaces

Yongfeng Lu, Minghui Hong, B. W. Ang, 1997 .

A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

J.C.H. Phang, Ludwig Josef Balk, V. Wittpahl, 1996, Proceedings of International Reliability Physics Symposium.