H. J. Wen

Localized degradation studies of ultrathin gate oxides

H. J. Wen, R. Ludeke, 1998 .

Gate oxide characterization with Ballistic Electron Emission Microscopy

H. J. Wen, R. Ludeke, H. Wen, 1997 .

Investigation of existing defects and defect generation in device-grade SiO2 by ballistic electron emission spectroscopy

H. J. Wen, R. Ludeke, 1997 .

Localized electron trapping and trap distributions in SiO2 gate oxides

H. J. Wen, R. Ludeke, H. Wen, 1997 .