T. Saito

A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET

H. Iwai, B. Ricco, C. Fiegna, 1993, Symposium 1993 on VLSI Technology.

Variation of Physical Properties of Igneous Rocks In Weathering

T. Saito, 1981 .