D.C. Eng
发表
J. Scarpulla,
D.C. Eng,
S. Brown,
1996,
IEEE Electron Device Letters.
Reliability Evaluation of 0.1 μm AlSb/InAs HEMT Low Noise Amplifiers for Ultralow-Power Applications
J.M. Yang,
J. B. Boos,
Y.C. Chou,
2007,
2007 ROCS Workshop[Reliability of Compound Semiconductors Digest].