W. Wijaranakula

The Effect of the Crystal Grown‐in Defects on the Pause Tail Characteristics of Megabit Dynamic Random Access Memory Devices

Sun S. Kim, W. Wijaranakula, W. Wijaranakula, 1994 .

An experimental estimation of silicon interstitial diffusivity

W. Wijaranakula, W. Wijaranakula, 1990 .