Nan Wu
发表
Effect of surface NH3 anneal on the physical and electrical properties of HfO2 films on Ge substrate
Albert Chin,
D.S.H. Chan,
Narayanan Balasubramanian,
2004
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Fei Gao,
Fei Gao,
D. Kwong,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
Albert Chin,
D.S.H. Chan,
Narayanan Balasubramanian,
2004
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Minghui Hong,
Qingchun Zhang,
Guoxin Chen,
2006,
IEEE Electron Device Letters.
Qingchun Zhang,
Lakshmi Kanta Bera,
Chunxiang Zhu,
2005
.