Inseok Hur

Hybrid $C$ – $V$ and $I$ – $V$ Technique for Separate Extraction of Structure- and Bias-Dependent Parasitic Resistances in a-InGaZnO TFTs

Dong Myong Kim, Dae Hwan Kim, Keum-Dong Jung, 2012 .

Characterization of density-of-states and parasitic resistance in a-InGaZnO thin-film transistors after negative bias stress

Sung-Jin Choi, Dong Myong Kim, Sungwoo Jun, 2013 .

Modified Conductance Method for Extraction of Subgap Density of States in a-IGZO Thin-Film Transistors

Dong Myong Kim, Sungwoo Jun, Dae Hwan Kim, 2012, IEEE Electron Device Letters.

Differential Ideality Factor Technique for Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2012, IEEE Electron Device Letters.

Analytical Models for Drain Current and Gate Capacitance in Amorphous InGaZnO Thin-Film Transistors With Effective Carrier Density

Dong Myong Kim, Jaehyeong Kim, Dae Hwan Kim, 2011, IEEE Electron Device Letters.

Characterization of Intrinsic Field-Effect Mobility in TFTs by De-Embedding the Effect of Parasitic Source and Drain Resistances

Dong Myong Kim, Jaehyeong Kim, Sungwoo Jun, 2013, IEEE Electron Device Letters.