Rob van Dalen

Design and use of an array-based test structure to characterize mechanical stress effects caused by WLCSP solder bumps

Hans Tuinhout, Rob van Dalen, 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS).

QUBiC generation 9, a new BiCMOS process optimized for mmWave applications

Luuk Tiemeijer, Hans Tuinhout, Rob van Dalen, 2015, 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM.