M. A. Carts

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

John D. Cressler, Michael L. Alles, Paul W. Marshall, 2007 .

System level radiation response of a high performance fiber optic data bus

Kenneth A. LaBel, Cheryl J. Dale, P. W. Marshall, 1995 .

Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory

K. A. LaBel, M. Friendlich, T. R. Oldham, 2011, IEEE Transactions on Nuclear Science.

Proton-induced transient effects in a metal-semiconductor-metal (MSM) photodetector for optical-based data transfer

Kenneth A. LaBel, Paul W. Marshall, Cheryl J. Marshall, 1998 .

Single Event Upset cross sections at various data rates

P. W. Marshall, Robert A. Reed, Dale McMorrow, 1996 .

Heavy ion SEU immunity of a GaAs complementary HIGFET circuit fabricated on a low temperature grown buffer layer

Jim Nohava, Cheryl J. Dale, P. W. Marshall, 1995 .