Pascal Fouillat

发表

Localization and characterization of latch‐up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Pascal Fouillat, Yves Danto, J. P. Dom, 1993 .

Theoretical Investigation of an Equivalent Laser LET

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2001, Microelectron. Reliab..

Effect of physical defect on shmoos in CMOS DSM technologies

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2008, Microelectron. Reliab..

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

Philippe Perdu, Dean Lewis, David Trémouilles, 2003, Microelectron. Reliab..

Investigation of Single-Event Transients in

Yann Deval, John D. Cressler, Pascal Fouillat, 2003 .

Test structures for analyzing proton radiation effects in bipolar technologies

R. L. Pease, Kenneth F. Galloway, Ronald D. Schrimpf, 2002, ICMTS 2002.

L’innovation comme moteur d’évolution des technologies de l’information ; vers un rapprochement des techniques et des usages.

Bernard Claverie, Pascal Fouillat, 2009 .

Understanding the effects of NIR laser stimulation on NMOS transistor

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2004, Microelectron. Reliab..

Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing

Hervé Lapuyade, Pascal Fouillat, J. P. Dom, 1994 .

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2006, Microelectron. Reliab..

Investigation of single-event transients in voltage-controlled oscillators

Yann Deval, John D. Cressler, V. Pouget, 2003 .

A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2005 .

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

D. Lewis, Pascal Fouillat, V. Pouget, 2003, Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412).

A new laser system for X-rays flashes sensitivity evaluation

Hervé Lapuyade, Yann Deval, Dean Lewis, 2001, Proceedings Seventh International On-Line Testing Workshop.

The synchronous oscillator in frequency generation: an overview

Hervé Lapuyade, Yann Deval, Eric Kerherve, 2002, The 14th International Conference on Microelectronics,.

On chip I/sub DDX/ sensor

Y. Deval, Pascal Fouillat, Jean Tomas, 1996, Digest of Papers 1996 IEEE International Workshop on IDDQ Testing.

Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education

Yann Deval, Jean Paul Dom, Pascal Fouillat, 1997, Proceedings of International Conference on Microelectronic Systems Education.

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects

Hervé Lapuyade, Nadine Buard, Thierry Carrière, 2003, Microelectron. Reliab..

Electrical modeling for laser testing with different pulse durations

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2005, 11th IEEE International On-Line Testing Symposium.

On Chip IDDX Sensor

Jean Paul Dom, Y. Deval, Pascal Fouillat, 1996 .

Validation of radiation hardened designs by pulsed laser testing and SPICE analysis

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 1999 .

Comments by the Chairman

Pascal Fouillat, 2013 .

A physical approach on SCOBIC investigation in VLSI

Philippe Perdu, Dean Lewis, Yves Danto, 2003, Microelectron. Reliab..

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

Hervé Lapuyade, André Touboul, Philippe Perdu, 2001, Microelectron. Reliab..

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2004, IEEE Transactions on Instrumentation and Measurement.

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections

Romain Desplats, Dean Lewis, Pascal Fouillat, 2004, Microelectron. Reliab..

Radiation Effects on Embedded Systems

Ricardo Reis, Raoul Velazco, Pascal Fouillat, 2010 .

Phase error determination in GMSK modulated fractional-N PLL

Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, 2001, ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483).

Hierarchical analogue design and behavioural modelling

Thomas Zimmer, Ahmed Fakhfakh, Hervé Levi, 1999, Proceedings 1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) 'Systems Education in the 21st Century' (Cat. No.99-63794).

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2000 .

Table of Contents IOLTS 2005

Philippe Perdu, V. Pouget, Pascal Fouillat, 2005 .

An overview of the applications of a pulsed laser system for SEU testing

Hervé Lapuyade, Dean Lewis, S. Duzellier, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

Impact of semiconductors material on IR Laser Stimulation signal

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005, Microelectron. Reliab..

Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

Pascal Fouillat, Yves Danto, J. P. Dom, 1992 .

Single Event Transients (SETs) in RF Circuits

Hervé Lapuyade, John D. Cressler, Pascal Fouillat, 2006 .

A CMOS Resizing Methodology for Analog Circuits

Noëlle Lewis, Timothée Levi, Pascal Fouillat, 2009, IEEE Design & Test of Computers.

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

Raoul Velazco, Dean Lewis, Pascal Fouillat, 2008, 2008 14th IEEE International On-Line Testing Symposium.

Method and digital data transmission device in series

Yann Deval, Pascal Fouillat, Gall Michel Le, 2002 .

A new industrial approach compatible with microelectronics education: application to an RF system design

Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, 1999, Proceedings 1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) 'Systems Education in the 21st Century' (Cat. No.99-63794).

IP-based design for analogue ASICs: A case study

Noëlle Lewis, Timothée Levi, Pascal Fouillat, 2006 .

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2007 .

Implementing laser-based failure analysis methodologies using test vehicles

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005 .

Implementation of total dose effects in the bipolar junction transistor Gummel-Poon model

Kenneth F. Galloway, Ronald D. Schrimpf, Pascal Fouillat, 1997 .

Direct method for bipolar base-emitter and base-collector capacitance splitting using high frequency measurements

Hassene Mnif, Thomas Zimmer, Pascal Fouillat, 2001, Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212).

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2004 .

Backside laser testing of ICs for SET sensitivity evaluation

Hervé Lapuyade, D. Lewis, Philippe Perdu, 2001 .

Total dose effects on gate controlled lateral PNP bipolar junction transistors

Ronald D. Schrimpf, J. P. David, Pascal Fouillat, 1998 .

Elaboration of a New Pulsed Laser System for SEE Testing

Hervé Lapuyade, Raoul Velazco, Dean Lewis, 1998 .

Study of the interaction between heavy ions and integrated circuits using a pulsed laser beam

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2002 .

SET sensitive volume imaging and measurement with two-photon absorption laser testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2008 .

Dose-rate and irradiation temperature dependence of BJT SPICE model rad-parameters

Kenneth F. Galloway, Ronald D. Schrimpf, Pascal Fouillat, 1997 .

Backside SEU laser testing for commercial off-the-shelf SRAMs

Hervé Lapuyade, Nadine Buard, Pascal Fouillat, 2002 .

A VLSI CMOS 2 GHz active load body effect mixer

Yann Deval, Jean-Baptiste Begueret, Thierry Taris, 2001 .

GSample / s , 2-bit SiGe Digitizers for the ALMA Project . Paper II

Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, 2002 .

Minimizing gain degradation in lateral PNP bipolar junction transistors using gate control

Ronald D. Schrimpf, Pascal Fouillat, C. R. Cirba, 1999 .

SPICE modeling of the transient response of irradiated MOSFETs

Hervé Lapuyade, Yann Deval, V. Pouget, 1999 .

Calculation of heavy ion induced leakage current in n-MOSFETs

J. P. David, Pascal Fouillat, R. Briand, 2000 .

Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs

V. Pouget, Robert Ecoffet, S. Duzellier, 2000 .

Transit time parameter extraction for the HICUM bipolar compact model

Hassene Mnif, Thomas Zimmer, Pascal Fouillat, 2001, Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212).

Single-event sensitivity of a single SRAM cell

Hervé Lapuyade, D. Lewis, V. Pouget, 2002 .

ALMA Memo No . 410 Designing and Prototyping of 2-4 GHz Bandpass SiGe Digitizers and Associated Test Equipment for the ALMA Project

Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, 2002 .