Yves Danto

发表

Localization and characterization of latch‐up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Pascal Fouillat, Yves Danto, J. P. Dom, 1993 .

Improved Physical Understanding of Intermittent Failure in Continuous Monitoring Method

Hélène Fremont, Yves Danto, W. C. Maia Filho, 2007, IPFA 2007.

A general methodology using an electron beam tester applied to failure localization inside a logic integrated circuit

François Marc, Hélène Fremont, Yves Danto, 1995 .

Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations

Frédéric Verdier, Yves Danto, J.-Y. Deltage, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

The limits of automatic systems for defect location using e-beam testing

François Marc, Yves Danto, P. Jounet, 1996 .

Comparison between piezoelectric method and ultrasonic signal analysis for multilayer ceramic capacitors type II crack detection

Laurent Bechou, Yves Ousten, Bernard Tregon, 1997 .

Functionnal localization in integrated circuits by Signal Selective Voltage Contrast in a scanning electron microscope

François Marc, Yves Danto, Hélène Fremont, 1994 .

Improving Reliability Evaluation of Electronic Assemblies Using Early Physical and Electrical Indicators

Laurent Bechou, Yves Danto, Yves Ousten, 1997 .

Shorter failure analysis using a new application of IDDQ for defect localization in ICs

Romain Desplats, J. Benbrik, François Marc, 1998, Advanced Lithography.

Quick and exhaustive descrambling methodology for high-density static random access memories using voltage contrast

François Marc, Hélène Fremont, Yves Danto, 1994 .

Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

Pascal Fouillat, Yves Danto, J. P. Dom, 1992 .

Estimation of lifetime distributions on 1550-nm DFB laser diodes using Monte-Carlo statistic computations

Laurent Bechou, Bernard Tregon, Yannick Deshayes, 2004, SPIE Photonics Europe.

New methodology for localizing faults in programmable and commercial circuits

Romain Desplats, François Marc, Philippe Perdu, 1997 .

Improving Reliability of Electronic Assemblies Using Early Physical and Electrical Indicators

Laurent Bechou, Yves Danto, Yves Ousten, 1997 .

Laser Beam Lithography for Direct Patterning of Interconnections on Prediffused ASIC's

Hélène Fremont, Yves Danto, A. Fleury, 1995 .

Comparison of conventional and pseudomorphic HEMTs performances by drain current transient spectroscopy and L.F. channel noise

Jean-Michel Dumas, Nathalie Labat, Nathalie Saysset, 1996 .

Evolution of Reliability Assessment In PCB Assemblies

Jean-Yves Delétage, Hélène Fremont, Frédéric Verdier, 2001 .

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

Dean Lewis, Yves Danto, Stefan Dilhaire, 1994 .

Ultrasonic characterisation improvement of microassembling technologies using Time-Frequency analysis

Laurent Bechou, Yves Danto, Yves Ousten, 1997 .

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Yves Danto, J. P. Dom, Stefan Dilhaire, 1993 .

Induced damages on CMOS and bipolar integrated structures under focused ion beam irradiation

Romain Desplats, J. Benbrik, Bruno Benteo, 1998 .

The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies

Laurent Bechou, Yves Danto, Yves Ousten, 1998 .

Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.