J. P. Dom

发表

Localization and characterization of latch‐up sensitive areas using a laser beam: Influence on design rules of ICs in CMOS technology

Pascal Fouillat, Yves Danto, J. P. Dom, 1993 .

Sorting Out of Analogue IC Architectures using the DOE Method : a New Tool for Quality Design

Yann Deval, J. P. Dom, Jean Tomas, 2004 .

An intracorporal telemetry for strain gage transducer

Zhiqun Li, J. P. Dom, J-B. Begueret, 1996, Proceedings of Custom Integrated Circuits Conference.

Fast Prototyping for BiCMOS Analog Integrated Circuits Design

J. P. Dom, Jean Tomas, P. Fouillat, 1998 .

Implementation of Laser Beam Sensitive Cells : a new approach for integrated circuits testing

Hervé Lapuyade, Pascal Fouillat, J. P. Dom, 1994 .

Localization of faulty operators on an ASIC by the use of a laser beam

J. P. Dom, Pascal Fouillat, C. Bouvet, 1992, Proceedings Euro ASIC '92.

3.3 V CMOS built-in current sensor

Yann Deval, J. P. Dom, J-B. Begueret, 1997 .

Asics failure analysis using two complementary techniques: External electrical testing and internal contactless laser beam testing

Pascal Fouillat, Yves Danto, J. P. Dom, 1992 .

A New Current-Mode Synthesis Method for Dynamic Translinear Filters and its Applications in Hearing Instruments

J. P. Dom, J. Mulder, W. A. Serdijn, 1998 .

Ratiometric temperature stable current reference

Yann Deval, J. P. Dom, S. G. Ducouret, 1993 .

A low voltage and low power voltage/frequency converter with automatic offset compensation for biomedical telemetry

J. P. Dom, M. Zhang, 1997, 1997 2nd IEEE-CAS Region 8 Workshop on Analog and Mixed IC Design.

Design For Testability of Built-In Laser Sensitive Cells

Hervé Lapuyade, J. P. Dom, Jean Tomas, 1995 .

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Yves Danto, J. P. Dom, Stefan Dilhaire, 1993 .

Simple determination of BJT extrinsic base resistance

Thomas Zimmer, J. P. Dom, Ph. Cazenave, 1991 .