Johannes Müller

发表

Ferroelectricity in Simple Binary ZrO2 and HfO2.

Lothar Frey, Thomas Mikolajick, Uwe Schröder, 2012, Nano letters.

Ferroelectric Zr0.5Hf0.5O2 thin films for nonvolatile memory applications

Lothar Frey, Thomas Mikolajick, Uwe Schröder, 2011 .

Correlation between the macroscopic ferroelectric material properties of Si:HfO2 and the statistics of 28 nm FeFET memory arrays

S. Henker, Stefan Slesazeck, Thomas Mikolajick, 2016 .

Ferroelectricity in Si‐Doped HfO2 Revealed: A Binary Lead‐Free Ferroelectric

Amit Kumar, Thomas Mikolajick, Sergei V. Kalinin, 2014, Advanced materials.

Ferroelectric Hafnium Oxide Based Materials and Devices: Assessment of Current Status and Future Prospects

Thomas Mikolajick, Patrick Polakowski, T. Mikolajick, 2015 .

Impact of different dopants on the switching properties of ferroelectric hafniumoxide

Christoph Adelmann, Thomas Mikolajick, Sergei V. Kalinin, 2014 .

Wake-up effects in Si-doped hafnium oxide ferroelectric thin films

Fei Cao, Uwe Schröder, Dayu Zhou, 2013 .

Phase transitions in ferroelectric silicon doped hafnium oxide

Thomas Mikolajick, Uwe Schröder, Ulrich Böttger, 2011 .

Structural properties of as deposited and annealed ZrO2 influenced by atomic layer deposition, substrate, and doping

Anton J. Bauer, Elke Erben, Johannes Heitmann, 2013 .

Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric properties

Thomas Mikolajick, Uwe Schröder, Dominik Martin, 2012 .

Ferroelectricity in undoped hafnium oxide

Patrick Polakowski, Johannes Müller, P. Polakowski, 2015 .

Doped Hafnium Oxide – An Enabler for Ferroelectric Field Effect Transistors

Stefan Slesazeck, Thomas Mikolajick, Uwe Schröder, 2014 .

Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stress

Dionyz Pogany, Lutz Wilde, Clemens Ostermaier, 2014 .

Insights into electrical characteristics of silicon doped hafnium oxide ferroelectric thin films

Uwe Schröder, Dayu Zhou, Steve Knebel, 2012 .

Impact of interface variations on J-V and C-V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr(1-x)AlxO2 films

Heiner Ryssel, Anton J. Bauer, Uwe Schröder, 2009 .

Ferroelectricity and Antiferroelectricity of Doped Thin HfO2‐Based Films

Thomas Mikolajick, Uwe Schroeder, Cheol Seong Hwang, 2015, Advanced materials.

Ferroelectricity in yttrium-doped hafnium oxide

Lothar Frey, Thomas Mikolajick, Uwe Schröder, 2011 .

Invited) Integration Challenges of Ferroelectric Hafnium Oxide Based Embedded Memory

Stefan Slesazeck, Halid Mulaosmanovic, Thomas Mikolajick, 2015 .