Masayoshi Ichikawa

Automatic defects separation from background LSI patterns using advanced image processing techniques

Tadashi Shibata, Tadahiro Ohmi, Kazuyuki Maruo, 1997, 1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023).

Automatic Defect Pattern Detection on LSI Wafers Using Image Processing Techniques

Tadashi Shibata, Tadahiro Ohmi, Kazuyuki Maruo, 1999 .

An image processing apparatus and image processing method

Kazuyuki Maruo, Masayoshi Ichikawa, Takahiro Yamaguchi, 1999 .

A dynamically-reconfigurable image recognition processor

Koji Kotani, Tadahiro Ohmi, Naoto Miyamoto, 2004, 18th International Parallel and Distributed Processing Symposium, 2004. Proceedings..