Jaeyeop Ahn

发表

Modeling and Separate Extraction Technique for Gate Bias-Dependent Parasitic Resistances and Overlap Length in MOSFETs

Jun Tae Jang, Sung-Jin Choi, Dong Myong Kim, 2015, IEEE Transactions on Electron Devices.

Single-Scan Monochromatic Photonic Capacitance-Voltage Technique for Extraction of Subgap DOS Over the Bandgap in Amorphous Semiconductor TFTs

Sung-Jin Choi, Dong Myong Kim, Sungwoo Jun, 2013, IEEE Electron Device Letters.