Naoki Wakita

HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS

Hironori Sakamoto, Shigetaka Kumashiro, Shigeo Sato, 2012, Thirteenth International Symposium on Quality Electronic Design (ISQED).

Statistical simulation of MOSFETs using TCAD: meshing noise problem and selection of factors

Naoki Wakita, Naoyuki Shigyo, H. Tanimoto, 1998, IWSM. 1998 3rd International Workshop on Statistical Metrology (Cat. No.98EX113).

Risk management of LSI design by spice parameter QA methodology

Ryosuke Inagaki, Hiroo Masuda, Naoki Wakita, 2009, 2009 MIXDES-16th International Conference Mixed Design of Integrated Circuits & Systems.

The Design of Self-Cheking Checkers For Some Classes of Hadamard codes

Naoki Wakita, Yoshihiro Iwadare, Ken-ichi Takagi, 1995 .

The design of totally self-checking checkers for some classes of Hadamard codes

Naoki Wakita, Yoshihiro Iwadare, Ken-ich Takagi, 1996, Proceedings of Annual Symposium on Fault Tolerant Computing.

Comprehensive quality assurance methodology for BSIM4.5 corner parameter extraction

Ryosuke Inagaki, Hiroo Masuda, Naoki Wakita, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

Verification of overlap and fringing capacitance models for MOSFETs

Naoki Wakita, Naoyuki Shigyo, 2000 .

Technology CAD based statistical simulation of MOSFETs

Naoki Wakita, Naoyuki Shigyo, Kenichi Sugawara, 2000 .