Claus Richter

Microdeflectometry - a novel tool to acquire 3D microtopology with nanometer height resolution

Gerd Häusler, Markus C. Knauer, Karl-Heinz Leitz, 2007 .

Optimization of white light interferometry on rough surfaces based on error analysis

Gerd Häusler, Zehra Saraç, Claus Richter, 2004 .

Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolution.

Gerd Häusler, Karl-Heinz Leitz, G. Häusler, 2007, Optics letters.

Deflectometry: 3D-Metrology from Nanometer to Meter

Christian Faber, Gerd Häusler, Markus C. Knauer, 2009 .

Measuring the refractive power with deflectometry in transmission

Gerd Häusler, Markus C. Knauer, Claus Richter, 2008 .