Alan J. Kubis

Analysis of the three-dimensional ordering of epitaxial Ge quantum dots using focused ion beam tomography

John C. Bean, Derren Dunn, Thomas E. Vandervelde, 2006 .

The effect of two-temperature capping on germanium/silicon quantum dots and analysis of superlattices so composed

John C. Bean, Thomas E. Vandervelde, James L. Merz, 2006 .

Focused ion-beam tomography

Derren Dunn, Robert Hull, Gary J. Shiflet, 2004 .