Kiyoshi Nikawa

发表

Laser THz emission microscope as a novel tool for LSI failure analysis

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, 2009, Microelectron. Reliab..

LSI failure analysis using focused laser beam heating

Kiyoshi Nikawa, Shoji Inoue, 1997 .

Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique

Toru Matsumoto, Kiyoshi Nikawa, Yasunori Goto, 2013, Microelectron. Reliab..

Failure analysis using the infrared optical-beam-induced resistance-CHange (IR-OBIRCH) method : Technologies supporting semiconductor scientific manufacturing : Process monitoring, testing, failure analysis and reliability

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 2000 .

Highly Sensitive OBIRCH System for Fault Localization and Defect Detection

Kiyoshi Nikawa, Shoji Inoue, 1998 .

LSI fast fault localization by continuously gated fault imaging method

Toyokazu Nakamura, Kiyoshi Nikawa, Yasuko Hanagama, 1994 .

VLSI failure analysis : a review

Kiyoshi Nikawa, 1992 .

Novel image-based LSI diagnostic method using E-beam without CAD database

Toyokazu Nakamura, K. Kanai, Kiyoshi Nikawa, 1992, Proceedings First Asian Test Symposium (ATS `92).

Failure Analysis in Si Device Chips (Special Issue on LSI Failure Analysis)

Kiyoshi Nikawa, 1994 .

Failure analysis case studies using the IR-OBIRCH (infrared optical beam induced resistance change) method

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, 1999, Asian Test Symposium.

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis

Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae, 2009, IEICE Trans. Electron..

How long can we succeed using the OBIRCH and its derivatives?

Kiyoshi Nikawa, 2004, 2004 International Conferce on Test.

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization

Masatsugu Yamashita, Toru Matsumoto, Yoshihiro Midoh, 2011, Microelectron. Reliab..

New capabilities of OBIRCH method for fault localization and defect detection

Kiyoshi Nikawa, Shoji Inoue, K. Nikawa, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis.

Masatsugu Yamashita, Chiko Otani, Hironaru Murakami, 2011, Optics express.

Backside observation of large-scale integrated circuits with multilayered interconnections using laser terahertz emission microscope

Masatsugu Yamashita, Chiko Otani, Hironaru Murakami, 2009 .

Non-electrical-contact LSI failure analysis using non-bias laser terahertz emission microscope

Masatsugu Yamashita, Chiko Otani, Masayoshi Tonouchi, 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Laser-SQUID Microscopy as a Novel Tool for Inspection, Monitoring and Analysis of LSI-Chip-Defects: Nondestructive and Non-electrical-contact Technique

Kiyoshi Nikawa, 2002 .

Noncontact inspection technique for electrical failures in semiconductor devices using a laser terahertz emission microscope

Masatsugu Yamashita, Chiko Otani, Masayoshi Tonouchi, 2008 .

Electromigration of Sputtered Al-Si Alloy Films

Kiyoshi Nikawa, Eiji Nagasawa, Hidekazu Okabayashi, 1979, 17th International Reliability Physics Symposium.

VLSI Fault Localization Using Electron Beam Voltage Contrast Image -Novel Image Acquisition and Localization Method-

Kiyoshi Nikawa, Yasuko Hanagama, Kenji Morohashi, 1992 .