Li-Han Kau

Correlation of Impedance Matching and Optical Emission Spectroscopy during Plasma-Enhanced Chemical Vapor Deposition of Nanocrystalline Silicon Thin Films

Y. Fuh, Chien-Chieh Lee, Tomi T. T. Li, 2019, Coatings.

Large‐scale data principal component analysis of phase transition from a‐Si:H to nc‐Si:H using PECVD optical emission spectra

Y. Fuh, Tomi T. T. Li, Li-Han Kau, 2020 .

A lab-on-phone instrument with varifocal microscope via a liquid-actuated aspheric lens (LAL)

Y. Fuh, Li-Han Kau, Hung-Jui Huang, 2017, PloS one.

In Situ Plasma Monitoring of PECVD nc-Si:H Films and the Influence of Dilution Ratio on Structural Evolution

Y. Fuh, Chien-Chieh Lee, Tomi T. T. Li, 2018, Coatings.

Large-scale data analysis of PECVD amorphous silicon interface passivation layer via the optical emission spectra for parameterized PCA

Y. Fuh, Chien-Chieh Lee, Tomi T. T. Li, 2018, The International Journal of Advanced Manufacturing Technology.

In-situ plasma monitoring of PECVD a-Si:H(i)/a-Si:H (n) surface passivation for heterojunction solar cells application

Y. Fuh, Chien-Chieh Lee, Tomi T. T. Li, 2018, 2018 China Semiconductor Technology International Conference (CSTIC).