R. Y. Koyama

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

G. J. Rogers, D. L. Blackburn, R. Y. Koyama, 1977 .

Measurement techniques for high power semiconductor materials and devices. Annual report, January 1, 1976--December 31, 1976. [Silicon wafers]

G. J. Rogers, D. L. Blackburn, R. Y. Koyama, 1977 .

Optical Properties of Indium

R. Y. Koyama, Neville V. Smith, William E. Spicer, 1973 .

GaAs field‐effect transistor properties, as influenced by the local concentrations of midgap native donors and dislocations

R. Y. Koyama, J. S. Blakemore, K. R. Gleason, 1985 .