F. F. Oettinger

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

G. J. Rogers, D. L. Blackburn, R. Y. Koyama, 1977 .

Thermal hysteresis and its possible effect in restricting the hot-spot-free operating range of some power transistors

F. F. Oettinger, S. Rubin, 1971 .

Measurement techniques for high power semiconductor materials and devices. Annual report, January 1, 1976--December 31, 1976. [Silicon wafers]

G. J. Rogers, D. L. Blackburn, R. Y. Koyama, 1977 .

Thermal evaluation of VLSI packages using test chips ― A critical review

F. F. Oettinger, 1984 .

Measurement techniques for high power semiconductor materials and devices. Annual report, January 1--December 31, 1977. [Photovoltaic technique, deep level measurements, and spreading resistance measurements]

F. F. Oettinger, 1977 .

Thermal response measurements for semiconductor device die attachment evaluation

F. F. Oettinger, F. Oettinger, R. Gladhill, 1973 .