R. Nishi
发表
An automatic method of detecting and tracking fiducial markers for alignment in electron tomography.
Meng Cao,
Akio Takaoka,
Ryuji Nishi,
2011,
Journal of electron microscopy.
M. Ozaki,
Shu Tanaka,
H. Yoshida,
2015,
Scientific Reports.
R. Nishi,
T. Nishida,
Y. Endo,
2020,
Journal of microscopy.
F. Wang,
M. Cao,
R. Nishi,
2017,
Micron.
T. Sakata,
Y. Oshima,
E. Taguchi,
2013,
Microscopy.
T. Sakata,
R. Nishi,
J. Miura,
2013,
Microscopy.
O. Custance,
S. Morita,
I. Yi,
2005
.
Seizo Morita,
Insook Yi,
Yasuhiro Sugawara,
2004
.
Meng Cao,
Ryuji Nishi,
M. Cao,
2009,
The Review of scientific instruments.
Seizo Morita,
Yasuhiro Sugawara,
Ryuji Nishi,
2000
.
Lateral Manipulation of Single Defect on Insulating Surface Using Noncontact Atomic Force Microscope
S. Morita,
I. Yi,
R. Nishi,
2011
.
Y. Sugawara,
O. Custance,
S. Morita,
2003
.
S. Morita,
I. Yi,
R. Nishi,
2006
.
Y. Sugawara,
S. Morita,
I. Yi,
2006
.
S. Morita,
I. Yi,
R. Nishi,
2007
.
S. Morita,
I. Yi,
R. Nishi,
2006,
Nanotechnology.
O. Custance,
S. Morita,
I. Yi,
2005
.
Y. Sugawara,
O. Custance,
S. Morita,
2005
.
S. Morita,
I. Yi,
R. Nishi,
2007
.
Y. Sugawara,
S. Morita,
R. Nishi,
2003
.
F. Wang,
M. Cao,
Hai-bo Zhang,
2013,
Micron.
F. Wang,
A. Takaoka,
M. Cao,
2010,
Micron.
F. Wang,
A. Takaoka,
M. Cao,
2010,
Ultramicroscopy.
Y. Sugawara,
T. Okada,
S. Morita,
1997
.
K. Matsushige,
K. Kobayashi,
H. Yamada,
2011
.
Ying Sun,
F. Wang,
M. Cao,
2016,
Micron.
F. Wang,
A. Takaoka,
M. Cao,
2011,
Journal of electron microscopy.
F. Wang,
A. Takaoka,
M. Cao,
2011,
The Review of scientific instruments.
M Cao,
H-B Zhang,
Y Lu,
2010,
Journal of microscopy.
R Nishi,
A Takaoka,
A. Takaoka,
1996,
Ultramicroscopy.
F. Wang,
A. Takaoka,
M. Cao,
2010,
Micron.