Yann Weber

Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect

Jeff Chen, Yann Weber, Linda Buffo, 2014, Microelectron. Reliab..

Characterisation of P floating islands for 150-200 V FLYMOSFETs

Gérard Sarrabayrouse, Yann Weber, Jean-Michel Reynes, 2007, IET Circuits Devices Syst..

Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion

Yann Weber, Julien Goxe, M. Castignolles, 2013, Microelectron. Reliab..

Mechanism of breakdown voltage wavering in power MOSFET induced by silicon crystalline defect

Yann Weber, 2011, Microelectron. Reliab..

Switching performance of 65 V vertical N-channel FLYMOSFETs

Karine Isoird, Yann Weber, Jean-Michel Reynes, 2008, Microelectron. J..

Aluminum metallization and wire bonding aging in power MOSFET modules

Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, 2018 .