Jinlong Zhang

RF circuit performance degradation due to soft breakdown and hot-carrier effect in deep-submicrometer CMOS technology

Wei Li, A. S. Oates, Jiann-Shiun Yuan, 2001 .

Modeling of direct tunneling and surface roughness effects on C–V characteristics of ultra-thin gate MOS capacitors

Y. Ma, A. Oates, Jinlong Zhang, 2001 .

Surface roughness effect on gate leakage and C-V characteristics of deep submicron MOSFETs

A. Oates, J. Yuan, Jinlong Zhang, 2000, 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515).