C. Gourdon

An advanced low-frequency noise model of GaInP-GaAs HBT for accurate prediction of phase noise in oscillators

M. Prigent, M. Camiade, A. Sion, 2005, IEEE Transactions on Microwave Theory and Techniques.

Reliability data's of 0.5 μm AlGaN/GaN on SiC technology qualification

D. Floriot, Hervé Blanck, Benoit Lambert, 2012, Microelectron. Reliab..