M. Depner

Reliability properties of low voltage PZT ferroelectric capacitors and arrays

H. McAdams, J. McPherson, K. Udayakumar, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Embedded ferroelectric memory using a 130-nm 5 metal layer Cu / FSG logic process

H. McAdams, K. Udayakumar, J. Rodriguez, 2004, Proceedings. 2004 IEEE Computational Systems Bioinformatics Conference.

Reliability properties of low-voltage ferroelectric capacitors and memory arrays

K. Remack, K. Boku, T. Moise, 2004, IEEE Transactions on Device and Materials Reliability.

FRAM memory technology - advantages for low power, fast write, high endurance applications

John Rodriquez, K. R. Udayakumar, Scott R. Summerfelt, 2005, 2005 International Conference on Computer Design.