D. Ney
发表
F. Terrier,
V. Girault,
D. Ney,
2008,
Microelectron. Reliab..
L. Arnaud,
D. Ney,
Y. Wouters,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
Maud Vinet,
M.-P. Samson,
Charles-Antoine Guérin,
2017,
2017 47th European Solid-State Device Research Conference (ESSDERC).
X. Federspiel,
D. Ney,
V. Huard,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
X. Federspiel,
D. Ney,
L. Doyen,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
L. Arnaud,
D. Ney,
Y. Wouters,
2011,
2011 IEEE International Integrated Reliability Workshop Final Report.
X. Federspiel,
D. Ney,
V. Girault,
2003,
IEEE International Integrated Reliability Workshop Final Report, 2003.
L. Arnaud,
D. Ney,
Y. Wouters,
2009,
2009 IEEE International Integrated Reliability Workshop Final Report.
X. Federspiel,
D. Ney,
V. Girault,
2004,
IEEE International Integrated Reliability Workshop Final Report, 2004.
D. Ney,
Y. Wouters,
Y. Wouters,
2010,
2010 IEEE International Integrated Reliability Workshop Final Report.
L. Arnaud,
X. Federspiel,
D. Ney,
2006,
2006 IEEE International Integrated Reliability Workshop Final Report.
L. Arnaud,
D. Ney,
P. Waltz,
2011,
2011 International Reliability Physics Symposium.
P. Febvre,
D. Ney,
G. Angenieux,
2001
.
L. Arnaud,
D. Ney,
Y. Wouters,
2012,
2012 IEEE International Interconnect Technology Conference.
X. Garros,
P. Batude,
M. Vinet,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).