H. Aziza

发表

A novel flash EEPROM diagnosis methodology based on I–V signatures extraction

H. Aziza, J. Plantier, J.M. Portal, 2008, 2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).

EEPROM Compact Model with SILC Simulation Capability

R. Bouchakour, H. Aziza, J.M. Portal, 2006, 2006 7th Annual Non-Volatile Memory Technology Symposium.

An efficient model to evaluate the impact of design parameters on charge pump circuits’ performances: Application on RFID circuits

J.-M. Portal, E. Bergeret, H. Aziza, 2007, 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era.

A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Networks

H. Aziza, M. Moreau, A Perez, 2019, 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS).

Mixed test structure for soft and hard defect detection

H. Aziza, J.M. Portal, B. Borot, 2008, 2008 IEEE International Conference on Microelectronic Test Structures.

Octagonal MOSFET: Reliable device for low power analog applications

J.-M. Portal, Y. Joly, J.-L. Ogier, 2011, 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).

ReRAM ON/OFF resistance ratio degradation due to line resistance combined with device variability in 28nm FDSOI technology

J. Postel-Pellerin, M. Bocquet, J.-M. Portal, 2017, 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).

Gate Voltage Matching Investigation for Low-Power Analog Applications

Y. Joly, H. Aziza, P. Fornara, 2013, IEEE Transactions on Electron Devices.

Using design of experiment to diagnose analog blocks geometrical defects: Application to current reference circuits

H. Aziza, J-M. Portal, K. Castellani-Coulie, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

Fast Embedded Characterization of FEOL Variations in MOS Devices

H. Aziza, J.M. Portal, G. Bas, 2009, 2009 IEEE International Conference on Microelectronic Test Structures.

Investigation of EEPROM memories reliability during endurance and retention tests

H. Aziza, J.M. Portal, C. Reliaud, 2009, 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era.

EEPROMCompact ModelwithSILCSimulation Capability

Arnaud Regnier, H. Aziza, D. Nee, 2006 .

Matching degradation of threshold voltage and gate voltage of NMOSFET after Hot Carrier Injection stress

Y. Joly, H. Aziza, P. Fornara, 2011, Microelectron. Reliab..

Contribution to SER Prediction: A New Metric Based on RC Transient Simulations

G. Micolau, J.-M. Portal, H. Aziza, 2012, IEEE Transactions on Nuclear Science.

Evaluation of OxRAM cell variability impact on memory performances through electrical simulations

C. Muller, M. Bocquet, H. Aziza, 2011, 2011 11th Annual Non-Volatile Memory Technology Symposium Proceeding.

An efficient diagnosis methodology for charge pump circuits: Application to flash EEPROM devices

J.-M. Portal, E. Bergeret, H. Aziza, 2008, 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era.

A realistic fault simulation model for EEPROM memories

H. Aziza, J. Plantier, J-M. Portal, 2009, 2009 4th International Design and Test Workshop (IDT).

Reliability issues in flash memories: An on-line diagnosis and repair scheme for word line drivers

H. Aziza, J.M. Portal, O. Ginez, 2008, 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop.

Speeding up simulation time in EEPROM memory designs

H. Aziza, J.M. Portal, D. Nee, 2006, International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006..

Non Volatile Memory signatures extraction for defects diagnosis purpose

H. Aziza, J. Plantier, J-M. Portal, 2010, 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era.

Impact of SEU configurations on a SRAM cell response at circuit level

G. Micolau, H. Aziza, K. Castellani-Coulie, 2011, 2011 12th Latin American Test Workshop (LATW).

Peripheral Circuitry Impact on LEPROM Threshold Voltage

H. Aziza, J.M. Portal, C. Reliaud, 2007, 2007 Non-Volatile Memory Technology Symposium.

Active “multi-fingers”: Test structure to improve MOSFET matching in sub-threshold area

Y. Joly, H. Aziza, P. Fornara, 2012, 2012 IEEE International Conference on Microelectronic Test Structures.

Analysis of SEU parameters for the study of SRAM cells reliability under radiation

G. Micolau, H. Aziza, K. Castellani-Coulie, 2011, 2011 12th Latin American Test Workshop (LATW).

Test Structure for Process and Product Evaluation

H. Aziza, J.M. Portal, B. Borot, 2007, 2007 IEEE International Conference on Microelectronic Test Structures.

Development of a CMOS Oscillator Concept for Particle Detection and Tracking

G. Micolau, W. Rahajandraibe, H. Aziza, 2013, IEEE Transactions on Nuclear Science.

Comparison of a Readout Chain Dedicated to the Signal Conditioning of a Particle Detector and an Innovative Chain Based on a VCO Concept

G. Micolau, W. Rahajandraibe, H. Aziza, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).