C. Reliaud

A novel flash EEPROM diagnosis methodology based on I–V signatures extraction

H. Aziza, J. Plantier, J.M. Portal, 2008, 2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).

Investigation of EEPROM memories reliability during endurance and retention tests

H. Aziza, J.M. Portal, C. Reliaud, 2009, 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era.

Peripheral Circuitry Impact on LEPROM Threshold Voltage

H. Aziza, J.M. Portal, C. Reliaud, 2007, 2007 Non-Volatile Memory Technology Symposium.

EEEPROM tunnel oxide lifetime reliability prediction based on fast electrical stress tests

Hassen Aziza, Arnaud Regnier, J. Plantier, 2010 .