S. Watabe

发表

Experimental Investigation of Effect of Channel Doping Concentration on Random Telegraph Signal Noise

Tadahiro Ohmi, Shigetoshi Sugawa, Akinobu Teramoto, 2010 .

Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2010, 2010 IEEE International Reliability Physics Symposium.

New Statistical Evaluation Method for the Variation of Metal–Oxide–Semiconductor Field-Effect Transistors

Tadahiro Ohmi, Shigetoshi Sugawa, S. Watabe, 2007 .

Impact of Channel Doping Concentration on Random Telegraph Signal Noise

T. Ohmi, S. Sugawa, A. Teramoto, 2009 .

Asymmetry of RTS characteristics along source-drain direction and statistical analysis of process-induced RTS

Tadahiro Ohmi, Shigetoshi Sugawa, Yuki Kumagai, 2009, 2009 IEEE International Reliability Physics Symposium.

Statistical Analysis of Time Constant Ratio of Random Telegraph Signal with Very Large-Scale Array TEG

T. Ohmi, S. Sugawa, A. Teramoto, 2009 .

Stress-induced leakage current and random telegraph signal

Tadahiro Ohmi, Naoto Miyamoto, Shigetoshi Sugawa, 2009 .

A Test Circuit for Statistical Evaluation of $p-n$ Junction Leakage Current and its Noise

R. Kuroda, S. Watabe, S. Sugawa, 2012, IEEE Transactions on Semiconductor Manufacturing.

A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).

Analysis of Source Follower Random Telegraph Signal Using nMOS and pMOS Array TEG

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2007 .

Large-Scale Test Circuits for High-Speed and Highly Accurate Evaluation of Variability and Noise in Metal–Oxide–Semiconductor Field-Effect Transistor Electrical Characteristics

Tadahiro Ohmi, Naoto Miyamoto, Rihito Kuroda, 2011 .