A. Yonezawa

The study of time constant analysis in random telegraph noise at the subthreshold voltage region

R. Kuroda, S. Sugawa, T. Ohmi, 2013, 2013 IEEE International Reliability Physics Symposium (IRPS).

Impact of Random Telegraph Noise Reduction with Buried Channel MOSFET

Tadahiro Ohmi, Rihito Kuroda, S. Sugawa, 2011 .

A Statistical Evaluation of Random Telegraph Noise of In-Pixel Source Follower Equivalent Surface and Buried Channel Transistors

Rihito Kuroda, Akihiro Yonezawa, Akinobu Teramoto, 2013, IEEE Transactions on Electron Devices.

Analyzing correlation between multiple traps in RTN characteristics

Tadahiro Ohmi, Rihito Kuroda, Akihiro Yonezawa, 2014, 2014 IEEE International Reliability Physics Symposium.

Statistical analysis of Random Telegraph Noise reduction effect by separating channel from the interface

R. Kuroda, S. Sugawa, T. Ohmi, 2012, 2012 IEEE International Reliability Physics Symposium (IRPS).