N. Kwak

Grain size monitoring of 3D flash memory channel poly-Si using multiwavelength Raman spectroscopy

Woo Sik Yoo, Takeshi Ueda, Kitaek Kang, 2014, 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS).

Precise Comparison of Two-dimensional Dopant Profiles Measured by Low-voltage Scanning Electron Microscopy and Electron Holography Techniques

Jun-Mo Yang, C. Rhee, N. Kwak, 2012 .

Precise comparison of two-dimensional dopant profiles measured by electron holography and scanning capacitance microscopy

Jeoung Woo Kim, Jun-Mo Yang, N. Kwak, 2011, 2011 IEEE Nanotechnology Materials and Devices Conference.

Effect of annealing ambient on WSix(x=2.3) sidewall deformation and contact resistance in dichlorosilane-based W-polycide gate

Dong-Jin Kim, Sangwook Park, N. Kwak, 2001 .