Lei Jin
发表
Investigation of charge loss mechanisms IN 3D TANOS cylindrical junction-less charge trapping memory
Yan Wang,
Dandan Jiang,
Zongliang Huo,
2014,
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Z. Huo,
Lei Jin,
Chenglin Zhao,
2019,
IEEE Electron Device Letters.
Impact of Cycling Induced Intercell Trapped Charge on Retention Charge Loss in 3-D NAND Flash Memory
Z. Huo,
Lei Jin,
Xinlei Jia,
2020,
IEEE Journal of the Electron Devices Society.
Xingqi Zou,
Dandan Jiang,
Zongliang Huo,
2017,
IEEE Electron Device Letters.
Guoxing Chen,
Z. Huo,
Dandan Jiang,
2018,
IEEE Electron Device Letters.
Xingqi Zou,
Dandan Jiang,
Zhaoyun Tang,
2017
.
Su Liu,
Ming Liu,
Guoxing Chen,
2014
.
Ming Liu,
Tianchun Ye,
Z. Huo,
2015
.
Meilin Liu,
Baohe Yang,
Guoxing Chen,
2014
.
Liang Yan,
Z. Huo,
Lei Jin,
2019,
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Liang Yan,
Z. Huo,
Lei Jin,
2019,
IEEE Electron Device Letters.
Tianchun Ye,
Z. Huo,
Dandan Jiang,
2015
.
Z. Huo,
Lei Jin,
Da Li,
2020,
IEEE Electron Device Letters.
Z. Huo,
Lei Jin,
Chenyu Han,
2020,
Semiconductor Science and Technology.
Z. Huo,
Lei Jin,
Jun Liu,
2019,
Solid-State Electronics.
Lei Jin,
Xinlei Jia,
Jianquan Jia,
2023,
Micromachines.
Z. Huo,
Lei Jin,
Yali Song,
2022,
IEEE Electron Device Letters.
Yan Wang,
Lei Jin,
Dandan Jiang,
2014,
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Tao Yang,
Zhiliang Xia,
Lei Jin,
2023,
Micromachines.
Ming Liu,
Z. Huo,
Zhaoan Yu,
2014,
2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).
Tianchun Ye,
Z. Huo,
Lei Jin,
2023,
IEEE Electron Device Letters.