Geumho Ahn
发表
LRS retention fail based on joule heating effect in InGaZnO resistive-switching random access memory
Sung-Jin Choi,
D. M. Kim,
D. Kim,
2020
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Sung-Jin Choi,
D. M. Kim,
D. Kim,
2017
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Sung-Jin Choi,
D. M. Kim,
D. Kim,
2018,
IEEE Transactions on Electron Devices.
Sung-Jin Choi,
D. M. Kim,
D. Kim,
2018
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Jun Tae Jang,
Sung-Jin Choi,
Dong Myong Kim,
2017
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Sungho Kim,
Sung-Jin Choi,
Yongwoo Lee,
2018,
2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO).
Jun Tae Jang,
Sung-Jin Choi,
Dong Myong Kim,
2019,
Electronics.