Devin Verreck

Impact of Mechanical Stress on the Electrical Performance of 3D NAND

I. De Wolf, Antonio Arreghini, Arnaud Furnemont, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Can p-channel tunnel-field-effect transistors perform as good as n-channel tunnel-FETs?

Aaron Thean, Guido Groeseneken, Nadine Collaert, 2014 .

Record performance InGaAs homo-junction TFET with superior SS reliability over MOSFET

Rita Rooyackers, Anne Vandooren, Aaron Thean, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

Uniform Strain in Heterostructure Tunnel Field-Effect Transistors

Aaron Thean, Guido Groeseneken, Nadine Collaert, 2016, IEEE Electron Device Letters.

Quantum mechanical solver for confined heterostructure tunnel field-effect transistors

Aaron Thean, Guido Groeseneken, Nadine Collaert, 2014 .

Part I: Impact of Field-Induced Quantum Confinement on the Subthreshold Swing Behavior of Line TFETs

Eddy Simoen, Anne Vandooren, Guido Groeseneken, 2013, IEEE Transactions on Electron Devices.

Full-zone spectral envelope function formalism for the optimization of line and point tunnel field-effect transistors

Aaron Thean, Guido Groeseneken, Nadine Collaert, 2015 .