W. Abadeer

A Thin-Film SOI 180nm CMOS RF Switch

M. Levy, A. Botula, A. Joseph, 2009, 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems.

Structural dependence of dielectric breakdown in ultra-thin gate oxides and its relationship to soft breakdown modes and device failure

W. Abadeer, E. Nowak, J. Aitken, 1998, International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).

Determination of ultra-thin oxide voltages and thickness and the impact on reliability projection

Ernest Y. Wu, D. Brochu, W. Abadeer, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

Reliability of CMOS image sensor with polymer lightpipe

W. Abadeer, J. Adkisson, J. Ellis-Monaghan, 2007 .