D. Lawrence

发表

Hadean age for a post-magma-ocean zircon confirmed by atom-probe tomography

Simon A. Wilde, David J. Larson, D. Larson, 2014 .

Analysis of Bulk Dielectrics with Atom Probe Tomography

K. Stiller, D. Larson, T. Prosa, 2008, Microscopy and Microanalysis.

Complex Nanostructures in Shocked, Annealed, and Metamorphosed Baddeleyite Defined by Atom Probe Tomography

D. Larson, J. Darling, I. Martin, 2017 .

Atom Probe Tomography of Phalaborwa Baddeleyite and Reference Zircon BR266

D. Larson, T. Prosa, I. Martin, 2017 .

Advances in Specimen Preparation for Atom Probe Tomography

D. Larson, T. Prosa, T. Kelly, 2006, 2006 19th International Vacuum Nanoelectronics Conference.

Toward atom probe tomography of microelectronic devices

J. D. Olson, I. Martin, L. Renaud, 2011 .

From the Store Shelf to Device-Level Atom Probe Analysis: An Exercise in Feasibility

T. Prosa, I. Martin, D. Larson, 2011 .

Atom-Probe Tomography of Semiconductor Materials and Device Structures

P. Flaitz, L. Lauhon, P. Ronsheim, 2009 .

Atom Probe Tomography Analysis of Thick Film SiO2 and Oxide Interfaces: Conditions Leading to Improved Analysis Yield

D. Larson, T. Prosa, D. Lawrence, 2011, Microscopy and Microanalysis.

Specimen Preparation for Cross-Section Atom Probe Analysis

D. Lawrence, R. Alvis, D. Olson, 2008, Microscopy and Microanalysis.

Arsenic Segregation to Dislocation Loops in Silicon

D. Larson, T. Kelly, P. Clifton, 2008, Microscopy and Microanalysis.

Identification and Analysis of Fluorine Clustering in Boron Implants

P. Ronsheim, D. Reinhard, D. Lawrence, 2008, Microscopy and Microanalysis.

A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability

D. Larson, T. Prosa, D. Lawrence, 2018, Microscopy and Microanalysis.

In situ site-specific specimen preparation for atom probe tomography.

D Lawrence, J. D. Olson, B. Gorman, 2007, Ultramicroscopy.

Presidential Address. Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals

D. Larson, T. Kelly, J. Valley, 2015 .

Application of hydrocarbon plasmas for modifying near-surface characteristics of bearing steel

K. Sridharan, D. Lawrence, E. H. Wilson, 2004 .

Experimental Evaluation of Conditions Affecting Specimen Survivability in Atom Probe Tomography

D. Mangelinck, I. Martin, R. Martens, 2015, Microscopy and Microanalysis.

Improved Mass Resolving Power and Yield in Atom Probe Tomography

E. Oltman, D. Larson, T. Prosa, 2013, Microscopy and Microanalysis.

Prospects for Atom Probe Tomography of Commercial Semiconductor Devices

J. D. Olson, D. Larson, T. Prosa, 2011, Microscopy and Microanalysis.

Atomic Scale Compositional and Structural Characterization of Nanostructured Materials Using Combined FIB, STEM, and LEAP

B. Gorman, D. Larson, M. Kaufman, 2006, Microscopy and Microanalysis.

Developing detection efficiency standards for atom probe tomography

B. P. Geiser, Ty J. Prosa, D. Olson, 2014, Optics & Photonics - NanoScience + Engineering.

Site-specific Lift Out Sample Preparation Technique for Atom Probe Analysis

B. Gorman, K. Thompson, D. Lawrence, 2006, Microscopy and Microanalysis.

Atomic-scale age resolution of planetary events

D Lawrence, D. Larson, J. Darling, 2017, Nature Communications.

Atom Probe Tomography of Zircon and Baddeleyite Geochronology Standards

T. Prosa, I. Martin, D. Moser, 2015, Microscopy and Microanalysis.

Elemental and Isotopic Tomography at Single-Atom-Scale in 4.0 and 2.4 Ga Zircons

I. Martin, T. Kelly, J. Valley, 2012 .

Atom probe tomography of a commercial light emitting diode

P. Clifton, D. Lawrence, D. Larson, 2013 .

Atom Probe Tomography Analysis of Grain Boundaries in CdTe

V. Smentkowski, D. Larson, T. Prosa, 2012, Microscopy and Microanalysis.

ATOM PROBE TOMOGRAPHY FOR MICROELECTRONICS

B. P. Geiser, D. J. Larson, D Lawrence, 2011 .

Backside Lift-Out Specimen Preparation: Reversing the Analysis Direction in Atom Probe Tomography

D. Larson, T. Prosa, E. Marquis, 2009, Microscopy and Microanalysis.

Plasma source ion implantation technology for engineering surfaces of materials

K. Sridharan, P. Sandstrom, D. Lawrence, 2001 .